ray surface

It is possibly because oil in the target clamber forms carbon foil on the CCD surface and contaminates the X ray CCD. This foil filter absorbs more rays with N band than those of O band.

其原因可能是X射线CCD受到靶室油沾污，在表面形成了碳膜，对N带吸收较多。

Surface doses were obtained from measured X-ray tube output data. The correlative changes were observed among X-ray tube voltage, surface dose, air kerma, and the detection threshold concentration of iodine.

观察X线管电压、表面剂量、比释动能以及碘探测阈浓度之间的变化关系。

The X ray Diffraction Analysis of the Multiplex Doping sintering Layer on the Surface of Copper

铜表面多元渗-烧结层的X射线衍射分析

FWHM of X-ray rocking curve was adapted to characterize the surface damage.

采用 X 射线摇摆曲线的半峰宽表征了表面损伤程度.

A set of equations relating the characteristic X-ray intensities from elements in the film and its surface densities are formulated and solved for film composition. The quantitative dependence of attenuation of characteristic X-ray intensities of elements in substrate on increasing film thickness is used to determine the thickness.

由薄膜中元素所发出的特征X射线强度与其面密度之间的一组联立方程解出薄膜成份，利用衬底中元素的特征X射线强度随膜厚增大而衰减的定量关系确定膜厚。

The wear properties, surface appearance and anti-corrosion properties for these composite coatings were studied by X-ray diffraction, XPS, SEM.

利用摩擦磨损实验机、电化学综合测试仪、X射线光电子能谱（XPS）和扫描电子显微镜等分析复合镀层的摩擦磨损性能、耐腐蚀性能、表面形貌特性。

The surface appearance and molecular structures of PC films changed after γ-ray irradiation.

不管是否有氧存在，PC膜经γ射线辐照后其表面形貌与分子链结构将发生变化。

Study of First Break Tomographic Inversion and Static Corrections in Surface Model; straight ray path tomographic inversion

初至波表层模型层析正反演及层析静校正研究直射线路径层析成象反演

The atomization mechanism of europium nitrate on graphite probe surface in graphite furnace was investigated experimentally by X-ray diffraction spectrometry and X-ray photoelectron spectrometry.

用X-射线衍射分析与X-射线光电子能谱分析研究了硝酸铕在石墨炉内石墨探针表面原子化机理。

The small X-ray scatter was first time used to analyze surface and interface characteristics of Ti/ Cu and Nb/ Cu multilayer thin films. The reflectivity of soft X-ray and ultraviolet ray multilayer thin films was highly sensitive to the roughness of surface and interface.

首次应用小角X射线于Ti/Cu、Nb/Cu多层薄膜表面、界面粗糙度分析，发现软x光和紫外光反射多层薄膜对界面非常敏感。